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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-053-6310 Item Description: Microcircuit Digital | 5962 | 010536310 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | U | ||||
Part Number | isc | rnvc | rncc | HCC | MSDS | SADC |
Rom Prom Family 013 | C | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.745 INCHES MINIMUM AND 0.755 INCHES MAXIMUM" |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.252 INCHES MAXIMUM" |
ADAU | BODY HEIGHT | 0.115 INCHES MINIMUM AND 0.125 INCHES MAXIMUM" |
AEHX | MAXIMUM POWER DISSIPATION RATING | 480.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | +0.0/+75.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
AGAV | END ITEM IDENTIFICATION | TEST SET,FLIGHT LINE TYPE AN/ALM-154" |
CBBL | FEATURES PROVIDED | BIPOLAR AND MONOLITHIC AND HIGH SPEED AND SCHOTTKY AND PROGRAMMABLE AND PROGRAMMED AND W/ENABLE AND W/DISABLE AND W/BUFFERED OUTPUT AND W/DECODED OUTPUT AND EXPANDABLE" |
CQSJ | INCLOSURE MATERIAL | PLASTIC" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | 6 INPUT" |
CZEQ | TIME RATING PER CHACTERISTIC | 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
TEST | TEST DATA DOCUMENT | 80249-1SPS910076 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING D" |
ADAQ | BODY LENGTH | 0.745 INCHES MINIMUM AND 0.755 INCHES MAXIMUM" |
ADAT | BODY WIDTH | 0.245 INCHES MINIMUM AND 0.252 INCHES MAXIMUM" |
ADAU | BODY HEIGHT | 0.115 INCHES MINIMUM AND 0.125 INCHES MAXIMUM" |
AEHX | MAXIMUM POWER DISSIPATION RATING | 480.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | +0.0/+75.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
AGAV | END ITEM IDENTIFICATION | TEST SET,FLIGHT LINE TYPE AN/ALM-154" |
CBBL | FEATURES PROVIDED | BIPOLAR AND MONOLITHIC AND HIGH SPEED AND SCHOTTKY AND PROGRAMMABLE AND PROGRAMMED AND W/ENABLE AND W/DISABLE AND W/BUFFERED OUTPUT AND W/DECODED OUTPUT AND EXPANDABLE" |
CQSJ | INCLOSURE MATERIAL | PLASTIC" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | 6 INPUT" |
CZEQ | TIME RATING PER CHACTERISTIC | 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
TEST | TEST DATA DOCUMENT | 80249-1SPS910076 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING D" |
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