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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-519-5479 Item Description: Microcircuit Memory | 5962 | 015195479 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | isc | rnvc | rncc | HCC | MSDS | SADC |
IDT72103L35J | 5 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL POWER SOURCE AND 2.0 VOLTS MINIMUM INPUT LOGIC 1 AND 0.8 VOLTS MAXIMUM INPUT LOGIC 0 |
CZER | Memory Device Type | FIRST-IN FIRST-OUT |
FEAT | Special Features | CMOS PARALLEL/SERIAL FIFO USING 5O MHZ SERIAL INPUT/OUTPUT FREQUENCY |
CZZZ | Memory Capacity | 2048WORDSX9BITS |
CQZP | Input Circuit Pattern | 9 INPUT AND 13 INPUT |
CBBL | Features Provided | ELECTROSTATIC SENSITIVE AND HIGH SPEED AND LOW POWER AND INTERNALLY COMPENSATED AND EXPANDABLE AND ASYNCHRONOUS AND SELECTED ITEM |
TTQY | Terminal Type And Quantity | 44 J-HOOK |
CQSJ | Inclosure Material | PLASTIC |
CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT, PLASTIC ENCAPSULATED (SURFACE MOUNT) - PROCUREMENT AND SELECTION REQUIREMENTS (FOR SERIAL FIFO) |
ADAT | Body Width | 0.653 INCHES NOMINAL |
SPCL | Special Test Features | IDT42103L35J IS 100 PERCENT UPSCREENED PER PARA 3.1.1 OF DWG 89954/356A1407 BY APPROVED TEST FACILITY PIKES PEAK TEST LAB OR AMKOR TEST SERVICE FOR OPERATION IN TEMPERATURES OF -55C TO +125C. |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CQSZ | Inclosure Configuration | LEADED CHIP CARRIER |
ADAQ | Body Length | 0.653 INCHES NOMINAL |
ADAU | Body Height | 0.172 INCHES NOMINAL |
AGAV | End Item Identification | C-17A |
CTFT | Case Outline Source And Designator | MS-018-AC JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
MRC | Decoded Requirement | Clear Text Reply |
CRTL | Criticality Code Justification | CBBL |
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