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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-175-3767 Item Description: Semiconductor Device Diode | 5961 | 001753767 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | ||||
Part Number | isc | rnvc | rncc | HCC | MSDS | SADC |
Jan1n1186a | 1 | 1 | C | A |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | METAL" |
ABHP | OVERALL LENGTH | 1.453 INCHES MAXIMUM" |
AKPV | MOUNTING FACILITY QUANTITY | 1" |
AXGY | MOUNTING METHOD | THREADED STUD" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE" |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.667 INCHES MINIMUM AND 0.687 INCHES MAXIMUM" |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES" |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON" |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE, MAXIMUM PEAK TOTAL VALUE" |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 240.0 MAXIMUM NONREPETITIVE PEAK REVERSE VOLTAGE, MAXIMUM PEAK TOTAL VALUE AND" |
CTQX | CURRENT RATING PER CHARACTERISTIC | 35.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE" |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR" |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI" |
THSD | THREAD SERIES DESIGNATOR | UNF" |
TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB, SOLDER LUG" |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/297 GOVERNMENT SPECIFICATION" |
ABBH | INCLOSURE MATERIAL | METAL" |
ABHP | OVERALL LENGTH | 1.453 INCHES MAXIMUM" |
AKPV | MOUNTING FACILITY QUANTITY | 1" |
AXGY | MOUNTING METHOD | THREADED STUD" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE" |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.667 INCHES MINIMUM AND 0.687 INCHES MAXIMUM" |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES" |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON" |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE, MAXIMUM PEAK TOTAL VALUE" |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 240.0 MAXIMUM NONREPETITIVE PEAK REVERSE VOLTAGE, MAXIMUM PEAK TOTAL VALUE AND" |
CTQX | CURRENT RATING PER CHARACTERISTIC | 35.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE" |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR" |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI" |
THSD | THREAD SERIES DESIGNATOR | UNF" |
TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB, SOLDER LUG" |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/297 GOVERNMENT SPECIFICATION" |
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